Overview:

An Atomic Force Microscope (AFM) is a very high-resolution type of Scanning Probe Microscope, AFM, also referred to as SPM or Scanning Probe Microscopy, is a high-resolution imaging technique that can resolve features as small as an atomic lattice in the real space. It allows researchers to observe and manipulate at the molecular and atomic level.

Current model:

Asylum MFP-3D-BIO Atomic Force Microscope

 

Asylum-Research-MFP-Bio-AFM

See video for further information

The MFP-3D BIO is a high-performance Atomic Force Microscope (AFM) designed specifically for biological applications. It is a versatile AFM that combines molecular resolution imaging and pN force-based measurements on an inverted optical microscope. Combined with its ultra-low noise performance and unprecedented precision and accuracy, the MFP-3D-BIO has raised the bar for AFM instrumentation in bioscience

 

Main Features:

Technical Specifications:

AFM Head and Scanner
Operating modes

Contact mode, Acoustic A/C and phase imaging modes.
AFM in liquid: Contact, Acoustic A/C, Lateral Force Microscopy (LFM), Phase imaging mode, Force modulation mode, Adhesion force imaging and chemical force microscopy (CFM).
Other modes available include Magnetic Force microscopy (MFM), Conductive AFM and Electric force microscopy.
MicroAngeloTM nanolithography

Sample size

System supports samples dimensions up to 100mm x 100mm x 20mm (X x Y x Z).

XYZ Scan range

Scan range up to 90 µm x 90 µm x 7 µm (Noise level XY< 6Å, Z <3Å Adev).
They have independent x, -x, y, -y, z piezos for accurate, linearised flat scanning.

Optical Microscope & camera:

AFM software:

Other features:

Typical samples:

AFM can be used on a very wide variety of surfaces such as carbon nanotubes, thin films, coatings, graphene, metals, ceramics, particles, or biological samples etc.

Standards: 

Samples can be accessed in accordance with other standards: ASTM E2859 – 11(2017), ISO 18115 – 2, ISO 11775:2015, ISO 13095:2014, and ISO 21222:2020.