FOCAS Institute SEM Request Form

Overview:

The scanning electron microscope (SEM) is a type of electron microscope that images the sample surface by scanning it with a high-energy beam of electrons in a raster scan pattern. The electrons interact with the shells in atoms that make up the sample producing signals that contain information about the sample's surface topography, composition and other properties such as electrical conductivity.

Hitachi SU 6600 FESEM

The types of signals produced by an SEM include secondary electrons (SE), back-scattered electrons (BSE), characteristic X-rays, light (cathodoluminescence), specimen current and transmitted electrons (STEM). Generally the most common or standard detection mode is SE imaging. The spot size in a Field Emission SEM is smaller than in conventional SEM and can therefore produce very high-resolution images, revealing details in the range of 1 to 5 nm in size.

The SU 6600 is a variable pressure FESEM with a Schottky field emission electron gun which enables excess of 200nA probe current. The SU 6600 at the FOCAS Institute is capable of SE, BSE and STEM imaging. The attainable SE image resolution is 1.2nm/30kV. The instrument is equipped with a Gatan Alto 2500 cryotransfer stage.

Technical Specifications:

Secondary electron image resolution

Magnification

Electron optics


Lens system

Specimen stage


Movable range

Sample size

Detector

 

The cyrotransfer stage allows imaging and analysis of biological and other hydrated, beam or vacuum sensitive specimens. Cryo-SEM imaging does not dehydrate the sample ensuring that delicate structures are maintained without shrinkage.

Applications: